Should we deal with reference pixels / deal with bias / termal drifts / low order pickup noise?
See "MICADO System Design & Analysis" ELT-TRE-MCD-56300-0011, 2.0, 2021-04-12, 99 of 157
The detectors will be operated such that the outer 4 rows / columns of the arrays consist of reference pixels for making corrections for bias or thermal drifts and to remove the low frequency pickup noise, thus making the actual IR-sensitive array size smaller (4088 x 4088 pixels).
https://drive.google.com/file/d/1H-UPCKtBByRZRa-Gl__xda-WB6x14igB/edit?disco=AAAAMJkGD1A
And also https://jira.eso.org/browse/MIC-704
ELT MAN MCD 56305 0023 User Manual In the MICADO System Design & Analysis doc (ELT-TRE-MCD-56300-0011, p. 99) it states, "The detectors will be operated such that the outer 4 rows / columns of the arrays consist of reference pixels for making corrections for bias or thermal drifts and to remove the low frequency pickup noise, thus making the actual IR-sensitive array size smaller (4088 x 4088 pixels)."
There is no reference to this (slightly) reduced field size in the User Manual.
With reply by Eline Tolstoy:
This will be included in the next version of the document (at PAE) when this information is finalised. At this time we will also include information about dead columns etc, so that all information about unusable pixels is provided in one place.
However, it is not clear who will execute the corrections for bias, thermal drifts and low order pickup noise. Will detector Read-Out Electronics do that or data flow data reduction software?
For now we assume that this is taken care of by the Read-Out Electronics. So labeling the issue as 'backlog'.
@verdoes will mail Naidu to verify this; assigning this issue to him for now.
This will also affect the simulator, so tagging @kdleschinski too.